ECE Research Seminar Series

The ECE Department is honored to have Distinguished Speaker Jovan Brankov speak at the ECE Graduate Research Seminar. Brankov is an associate professor of electrical and computer engineering, an associate professor of biomedical engineering, and the Advance X-ray Imaging Laboratory (AXIL) director at Illinois Tech. He will discuss his research, "Analyzer Based Phase-Contrast X-ray Mammography."

Abstract

Analyzer-based phase contrast X-ray imaging (ABI) permits visualization of soft-tissue structures (such as in mammography) that are not detectable by conventional X-ray methods at reduced radiation dose to the patient. Therefore, it holds great potential for many human, small-animal, and microscopic bioimaging applications. ABI utilizes a semiconductor crystal, called an analyzer, to selectively measure the angular content of an X-ray beam after it passes through the object. The tiny beam deflections reveal fine detail, allowing extraordinary image quality for mammography and other soft-tissue applications. Academic Radiology called this technique the “third wave” in imaging breakthroughs, following shadowgraph imaging and computed tomography (CT). ABI has been well documented to produce extraordinary images at synchrotron facilities. Still, compact ABI prototypes have required imaging times that are far longer than practical for clinical use. In this talk, we will discuss a breakthrough approach, including a number of innovative design concepts that, when combined, are expected to deliver whole-breast imaging at 100 μm resolution in 10 seconds.

Biography

Brankov has been awarded over $4 million in NIH grants as Principal Investigator (P.I.) or subcontract P.I., and have been a key investigator on many grants totaling over $14 million in past 10 years. He is the author/co-author of 150 publications, two technical reports, two patents, and a book chapter on ABI imaging. He is currently serving as: associate editor for Transaction on Medical Imaging (IEEE), Medical Physics (AAPM) and Journal of Medical Imaging (SPIE), program committee member for IEEE International Symposium on Biomedical Imaging and SPIE Image Perception conferences, and member of Bioimaging and Signal Processing (BISP) Technical Committee of the IEEE Signal Processing Society. He was also an ad hoc reviewer for the NIH BMIT-A and B study sections. He is a SPIE, Sigma Xi member, and a senior member of IEEE technical communities.

Note: This seminar is open to everyone at Illinois Tech. For more information regarding this seminar, please contact Mahesh Krishnamurthy in ECE, Illinois Tech Phone: 7-7232, Email: kmahesh@ece.iit.edu

Earn Themes Credit in Health.

To get credit, you must complete the assignment listed in Blackboard.